i-T (Integral TOFD)

PATENT PENDING TECHNOLOGY
Faster and easier setup time—No connection between transducer and wedge necessary
Consistent sensitivity—No couplant inconsistencies between transducer and wedge pairing.
Greater reliability—Transducer and wedge cannot become loosened during use.
Eliminates the risk of breakage between transducer and wedge.
Available in a variety of angles, frequencies and crystal sizes.

 

 

              

Available options:
Axial and circumferential contouring
Fits all available scanners
Left and Right options for improved cable management
Variable contact faces
High Temperature versions
Couplant feed inputs as standard
A variety of connector styles
Integral cable versions also available if required

Source: https://www.gbinspection.com/products/probes-accessories/i-t-

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